| Project Number | Short Name | Title | Coordinator |
|---|---|---|---|
| 20IND07 | TracOptic | Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors | |
| 20IND08 | MetExSPM | Traceability of localised functional properties of nanostructures with high speed scanning probe microscopy | Virpi Korpelainen (MIKES) |
| 20IND09 | PowerElec | Metrology in manufacturing compound semiconductors for power electronics | Sebastian Wood (NPL) |
| 20IND10 | Decarb | Metrology for decarbonising the gas grid | Lucy Culleton (NPL) |
| 20IND11 | MetHyInfra | Metrology infrastructure for high-pressure gas and liquified hydrogen flows | Hans-Benjamin Böckler (PTB) |
| 20IND12 | Elena | Electrical nanoscale metrology in industry | François Piquemal (LNE) |
| 20IND13 | SAFEST | Sustainable advanced flow meter calibration for the transport sector | Corinna Kroner (PTB) |
| 20SIP05 | KTOC | Knowledge Transfer for Optical Communications | Irshaad Fatadin (NPL) |
| 23IND01 | ENSURE | Electric energy and supply reliability | Alf-Peter Elg (RISE) |
| 23IND02 | COMET | Manufacturing of commutable calibrators and quality control materials for standardisation and post-market surveillance of IVD tests | Vincent Delatour (LNE) |
| 23IND03 | RF 4 6G | RF key quantities for 6G development | Frauke Gellersen (PTB) |
| 23IND04 | MetSuperCap | Metrology for static and dynamic characterisation of supercapacitors | Mauro Zucca (INRiM) |
| 23IND05 | H2FlowTrace | Flow measurement traceability for hydrogen in gas networks | Rèmy Maury (LNE-LADG) |
| 23IND06 | Met4EVCS | Metrology for electric vehicle charging systems | Helko E. van den Brom (VSL) |
| 23IND07 | RadonNET | Radon metrology: Sensor networks for large buildings and future cities | Benoit Sabot (LNE-LNHB) |
| 23IND08 | DI-Vision | Traceable machine vision systems for digital industrial applications | Hichem Nouira (LNE) |
| 23IND09 | MaritimeMET | Metrology for green maritime shipping: Emission control through traceable measurements and machine learning approaches | Ajoy Ramalingam (PTB) |
| 23IND10 | OnMicro | On-wafer microwave metrology for future industrial applications | Gia Ngoc Phung (PTB) |
| 23IND11 | ThermoSI | Thermometry with embedded SI traceability for industrial applications | Henrik Kjeldsen (DTI) |
| 23IND12 | ADAM | Application of Digital-Metrological Twins for emerging measurement technology in advanced manufacturing | Daniel Heisselmann (PTB) |
92 result(s)