Test
| Project Number | Short Name | Title | Coordinator |
|---|---|---|---|
| 17IND03 | LaVA | Large Volume Metrology Applications | Andrew Lewis (NPL) |
| 17IND04 | EMPRESS 2 | Enhancing process efficiency through improved temperature measurement 2 | Jonathan Pearce (NPL) |
| 17IND05 | MicroProbes | Multifunctional ultrafast microprobes for on-the-machine measurements | Uwe Brand (PTB) |
| 17IND06 | FutureGrid II | Metrology for the next-generation digital substation instrumentation | Enrico Mohns (PTB) |
| 17IND07 | DynPT | Development of measurement and calibration techniques for dynamic pressures and temperatures | Richard Högström (MIKES) |
| 17IND08 | AdvanCT | Advanced Computed Tomography for dimensional and surface measurements in industry | Ulrich Neuschaefer-Rube (PTB) |
| 17IND09 | MetAMCII | Metrology for Airborne Molecular Contaminants II | Geoffrey Barwood (NPL) |
| 17IND10 | LiBforSecUse | Quality assessment of electric vehicle Li-ion batteries for second use applications | Steffen Seitz (PTB) |
| 17IND11 | Hi-TRACE | Industrial process optimisation through improved metrology of thermophysical properties | Bruno Hay (LNE) |
| 17IND12 | Met4FoF | Metrology for the Factory of the Future | Sascha Eichstädt (PTB) |
| 17IND13 | Metrowamet | Metrology for real-world domestic water metering | Corinna Kroner (PTB) |
| 17IND14 | WRITE | Precision Time for Industry | Davide Calonico (INRIM) |
| 19SIP02 | PlanarMeT | Knowledge transfer of planar calibration and measurement techniques at millimetre-wave frequencies | Nick Ridler (NPL) |
| 19SIP05 | TTPWC | Technology Transfer of Photonic Waveguide Characterisation | Irshaad Fatadin (NPL) |
| 20IND01 | MetroCycleEU | Metrology for the recycling of Technology Critical Elements to support Europe's circular economy agenda | Johanna Noireaux (LNE) |
| 20IND02 | DynaMITE | Dynamic applications of large volume metrology in industry of tomorrow environments | Andrew Lewis (NPL) |
| 20IND03 | FutureCom | RF Measurements for future communications applications | Dilbagh Singh (NPL) |
| 20IND04 | ATMOC | Traceable metrology of soft X-ray to IR optical constants and nanofilms for advanced manufacturing | Markus Bär (PTB) |
| 20IND05 | QADeT | Quantum sensors for metrology based on single-atom-like device technology | Paolo Traina (INRIM) |
| 20IND06 | PROMETH2O | Metrology for trace water in ultra-pure process gases | Vito C. Fernicola (INRIM) |
78 result(s)