Test
Project Number | Short Name | Title | Coordinator |
---|---|---|---|
IND52 | xDReflect | Multidimensional reflectometry for industry | Gael Obein (LNE-LCM/CNAM) |
17IND14 | WRITE | Precision Time for Industry | Davide Calonico (INRIM) |
14SIP01 | Vacuum ISO | Technical Specifications for quadrupole mass spectrometers and outgassing rates for assessing the quality of vacuum environments | Karl Jousten (PTB) |
IND12 | Vacuum | Vacuum metrology for production environments | Karl Jousten (PTB) |
IND16 | Ultrafast | Metrology for ultrafast electronics and high-speed communications | Mark Bieler (PTB) |
19SIP05 | TTPWC | Technology Transfer of Photonic Waveguide Characterisation | Irshaad Fatadin (NPL) |
20IND07 | TracOptic | Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors | Uwe Brand (PTB) |
IND62 | TIM | Traceable in-process dimensional measurement | |
IND07 | Thin Films | Metrology for the manufacturing of thin films | Fernando Araujo de Castro (NPL) |
14SIP05 | TF-STANDARD | Developing a Standard for Valid Methodology for the Characterisation of Functional Alloy Thin Films | Cornelia Streeck (PTB) |
14SIP04 | TF-Plastic | Standardisation and Dissemination for Measurements of High Performance Barrier Layers | Paul Brewer (NPL) |
IND13 | T3D | Thermal design and time-dependent dimensional drift behaviour of sensors, materials and structures | Jens Flügge (PTB) |
IND15 | SurfChem | Traceable quantitative surface chemical analysis for industrial applications | |
14IND03 | Strength-ABLE | Metrology for length-scale engineering of materials | Mark Gee (NPL) |
17IND02 | SmartCom | Communication and validation of smart data in IoT-networks | Wiebke Heeren (PTB) |
IND17 | Scatterometry | Metrology of small structures for the manufacturing of electronic and optical devices | Bernd Bodermann (PTB) |
20IND13 | SAFEST | Sustainable advanced flow meter calibration for the transport sector | Corinna Kroner (PTB) |
20IND05 | QADeT | Quantum sensors for metrology based on single-atom-like device technology | Paolo Traina (INRIM) |
IND56 | Q-AIMDS | Chemical metrology tools to support the manufacture of advanced biomaterials in the medical device industry | Fiona Moriarty (NPL) |
20IND06 | PROMETH2O | Metrology for trace water in ultra-pure process gases | Vito C. Fernicola (INRIM) |
78 result(s)