Test
| Project Number | Short Name | Title | Coordinator |
|---|---|---|---|
| 20IND07 | TracOptic | Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors | Uwe Brand (PTB) |
| 20IND04 | ATMOC | Traceable metrology of soft X-ray to IR optical constants and nanofilms for advanced manufacturing | Markus Bär (PTB) |
| IND59 | Microparts | Multi-sensor metrology for microparts in innovative industrial products | Ulrich Neuschaefer-Rube (PTB) |
| 17IND08 | AdvanCT | Advanced Computed Tomography for dimensional and surface measurements in industry | Ulrich Neuschaefer-Rube (PTB) |
| IND17 | Scatterometry | Metrology of small structures for the manufacturing of electronic and optical devices | Bernd Bodermann (PTB) |
| IND16 | Ultrafast | Metrology for ultrafast electronics and high-speed communications | Mark Bieler (PTB) |
| IND13 | T3D | Thermal design and time-dependent dimensional drift behaviour of sensors, materials and structures | Jens Flügge (PTB) |
| IND58 | 6DoF | Metrology for movement and positioning in six degrees of freedom | Jens Flügge (PTB) |
| IND12 | Vacuum | Vacuum metrology for production environments | Karl Jousten (PTB) |
| 14SIP01 | Vacuum ISO | Technical Specifications for quadrupole mass spectrometers and outgassing rates for assessing the quality of vacuum environments | Karl Jousten (PTB) |
| 17IND01 | MIMAS | Procedures allowing medical implant manufacturers to demonstrate compliance with MRI safety regulations | Bernd Ittermann (PTB) |
| IND08 | MetMags | Metrology for Advanced Industrial Magnetics | Hans Werner Schumacher (PTB) |
| IND52 | xDReflect | Multidimensional reflectometry for industry | Gael Obein (LNE-LCM/CNAM) |
| 17IND06 | FutureGrid II | Metrology for the next-generation digital substation instrumentation | Enrico Mohns (PTB) |
| IND60 | EMC | Improved EMC test methods in industrial environments | Mustafa Cetintas (UME) |
| 17IND14 | WRITE | Precision Time for Industry | Davide Calonico (INRIM) |
| IND01 | HiTeMS | High temperature metrology for industrial applications (>1000 °C) | Graham Machin (NPL) |
| IND53 | LUMINAR | Large volume metrology in industry | Andrew Lewis (NPL) |
| 17IND03 | LaVA | Large Volume Metrology Applications | Andrew Lewis (NPL) |
| 20IND02 | DynaMITE | Dynamic applications of large volume metrology in industry of tomorrow environments | Andrew Lewis (NPL) |
78 result(s)