Find all EURAMET Metrology Research Projects

TYPE
FIELD
PROJECT NUMBER
SHORT NAME
TITLE
SHORT DESCRIPTION
COORDINATOR
STATUS
CALL
EMPIR New Technologies 17SIP05 CASoft Software to maximize end user uptake of conformity assessment with measurement uncertainty A software tool for complex conformance testing of measurement devices completed 2017
EMPIR New Technologies 17SIP07 Adlab-XMet Advancing laboratory based X-ray metrology techniques Supporting the reliable calibration of laboratory x-ray measurement equipment Philipp Hönicke in progress 2017
iMERA-Plus Length T3.J1.1 Nanoparticles Traceable Characterisation of Nanoparticles Ever since the development of nanoparticles in the late 1960's and early 1970's they have been known to act as a bridge between atomic structures and bulk properties. This means they have potentially unique properties, for example as highly concentrated suspensions in the ink industry as drug delivery agents for the pharmaceutical industry, and in novel composite materials. Additional toxicological concerns require strict and well defined standards to be applied. completed 2007
iMERA-Plus Length T3.J1.4 NANOTRACE New Traceability Routes for Nanometrology Dimensional measurements play a crucial role in almost every aspect of modern life where the role of nanotechnologies in Information and Communication Technology is growing. Today laser interferometers are the essential tool for metrology in semiconductor manufacturing where they are used for pattern placement measurements on photomasks and for position control in wafer scanners. The accuracy demands of dimensional measurements are rapidly growing. Marco Pisani completed 2007
iMERA-Plus Length T3.J2.2 NIMTech Metrology for New Industrial Measurement Technologies Large objects up to (3 x 3 x 3) m³ can be measured with classical coordinate measuring machines, larger objects can be measured using mobile measuring equipment, like laser trackers, laser radar or indoor GPS. When starting the project, the traceability of such measurements was still an open issue as a qualified statement of the task specific measurement uncertainty. Frank Härtig completed 2007
iMERA-Plus Length T3.J3.1 Long distance Absolute long distance measurement in air When starting the project, long-range measurements were performed with electronic distance measurement (EDM) instruments. One of the best of these instruments is Kern Mekometer ME5000 with a measurement range of 20 to 8000 m. Many of these instruments are still in use, but new instruments have not been available since the 1990's. They are based on the principle of measuring the phase shift of a modulation frequency along the path measurement. Jean-Pierre Wallerand completed 2007
EMPIR Industry 19SIP05 TTPWC Technology Transfer of Photonic Waveguide Characterisation Improving standards to drive efficiency of optical data links that maximise the bandwidth of data centres Irshaad Fatadin in progress 2019
EMRP Industry IND01 HiTeMS High temperature metrology for industrial applications (>1000 °C) Making high temperature measurements: Reducing energy use through accurate temperature measurement Graham Machin completed 2010
EMRP Industry IND02 EMINDA Electromagnetic characterisation of materials for industrial applications up to microwave frequencies Advancing the European electronics industry: Measuring high-speed electronics Bob Clarke completed 2010
EMRP Industry IND03 HighPRES High pressure metrology for industrial applications Improving high pressure measurements: High-pressure measurements for industry Wladimir Sabuga completed 2010
EMRP Industry IND04 MetroMetal Ionising radiation metrology for the metallurgical industry Measuring radiation in scrap metals: Preventing the spread of radiation in European steel completed 2010
EMRP Industry IND05 MeProVisc Dynamic Mechanical Properties and Long-term Deformation Behaviour of Viscous Materials Enabling polymer use in industry: Improving confidence in polymer properties completed 2010
EMRP Industry IND06 MIQC Metrology for industrial quantum communication technologies Improving data security with quantum technology: Guaranteeing the security of sensitive data Maria Luisa Rastello completed 2010
EMRP Industry IND07 Thin Films Metrology for the manufacturing of thin films Enabling the development of thin film technology: Helping thin film technologies become a reality Fernando Araujo de Castro completed 2010
EMRP Industry IND08 MetMags Metrology for Advanced Industrial Magnetics Developing novel magnetic materials: Improving high-resolution electronic measurements Hans Werner Schumacher completed 2010
EMRP Industry IND09 Dynamic Traceable Dynamic Measurement of Mechanical Quantities Advancing the infrastructure for dynamic measurements: Ensuring reliable measurements of dynamic force, torque and pressure Thomas Bruns completed 2010
EMRP Industry IND10 Form Optical and tactile metrology for absolute form characterisation Measuring optical curved surfaces: Characterising free-form 3D surfaces Michael Schulz completed 2010
EMRP Industry IND11 MADES Metrology to Assess the Durability and Function of Engineered Surfaces Making measurements of engineered surfaces: Reducing wear and friction in components Mark Gee completed 2010
EMRP Industry IND12 Vacuum Vacuum metrology for production environments Strengthening industrial vacuums: Improving vacuum measurements for better end-products Karl Jousten completed 2010
EMRP Industry IND13 T3D Thermal design and time-dependent dimensional drift behaviour of sensors, materials and structures Ensuring consistent measurements over time and with temperature changes: Measurement consistency with time and temperature Jens Flügge completed 2010
381 result(s)