The gateway to Europe's
integrated metrology community.

Welcome to the EURAMET Repository Link

The EURAMET Repository Link is an online service providing links to scientific papers published within the European Partnership on Metrology (Partnership), the European Metrology Programme for Innovation and Research (EMPIR), the European Metrology Research Programme (EMRP), and projects funded by iMERA-Plus.

References
Full-scale experimental assessment of a radiant-capacitive cooling system driven by nocturnal and diurnal radiative cooling
González-Cruz E., Pérez G., Frutos B., Alonso C., Martin-Consuegra F., Gutierrez Á., Krüger E., Pattelli L.
2026

Building and Environment 304 (2026) , 115136

Type: Article
Project title: 21GRD03: PaRaMetriC: Metrological framework for passive radiative cooling technologies
Name of Call / Funding Programme: Metrology Partnership 2021: Green Deal
Experimental and computational structure study of the commercial NMC622 lithium-ion battery electrode
Braun A., Thompson P., Pomjakushin V., Ménesguen Y., Arcon I., Cain M., Nowak S., Winter M., Uslu E., Aycibin M., Erat S., Rulev A., Beckhoff B.
2026

Journal of Materials Research (2026)

Type: Article
Project title: 24GRD09: HyMetBat: Hybrid metrology for sustainable and low-carbon footprint battery materials
Name of Call / Funding Programme: Metrology Partnership 2024: Green Deal
Mathematical solutions to materials problems
Braun A.
2026

MRS Bulletin 51 (2026) , 867-869

Type: Article
Project title: 24GRD09: HyMetBat: Hybrid metrology for sustainable and low-carbon footprint battery materials
Name of Call / Funding Programme: Metrology Partnership 2024: Green Deal
A Comparative Study of Microstrip Line Models Up to 500 GHz
Phung G., Flisgen T., Streitenberger G., Kanitkar A., Arz U., Heinrich W.
2026

2026 IEEE 30th Workshop on Signal and Power Integrity (SPI) (2026) , 1-4

Type: Proceedings
Project title: 23IND10: OnMicro: On-wafer microwave metrology for future industrial applications
Name of Call / Funding Programme: Metrology Partnership 2023: Industry
The Importance of Material Measurement in on-Wafer Metrology
Phung G.
2026

2026 26th International Microwave and Radar Conference (MIKON) (2026) , 67-68

Type: Proceedings
Project title: 23IND10: OnMicro: On-wafer microwave metrology for future industrial applications
Name of Call / Funding Programme: Metrology Partnership 2023: Industry
Analysis of Multiline Calibration Algorithms for Various Transmission Line Types Up to 220 GHz
Streitenberger G., Phung G., Sayegh A., Li T., Hwang J.
2026

2026 107th ARFTG Microwave Measurement Conference (ARFTG) (2026) , 1-4

Type: Proceedings
Project title: 23IND10: OnMicro: On-wafer microwave metrology for future industrial applications
Name of Call / Funding Programme: Metrology Partnership 2023: Industry
Automated Planarization of GSG Probes for on-Wafer RF Measurements Using a Nanorobotic Probe Station
Lenoir C., Sebbache M., Phung G., Haddadi K.
2026

2026 107th ARFTG Microwave Measurement Conference (ARFTG) (2026) , 1-4

Type: Proceedings
Project title: 23IND10: OnMicro: On-wafer microwave metrology for future industrial applications
Name of Call / Funding Programme: Metrology Partnership 2023: Industry
A Fast and Reliable RF Probing Technique for Autonomous On-Wafer S-Parameter Measurements
Mubarak F., Poduval D., Khot A., Gugole F., Rajabali S., Spirito M.
2026

2026 107th ARFTG Microwave Measurement Conference (ARFTG) (2026) , 1-5

Type: Proceedings
Project title: 23IND10: OnMicro: On-wafer microwave metrology for future industrial applications
Name of Call / Funding Programme: Metrology Partnership 2023: Industry
Interlaboratory mmWave and THz Quasi-Optical Characterization of Commercial Conventional and 3-D Printable Substrates
Sari A., Premerlani R., Hales J., Constantinou C., Gunn J., Ridler N., Naftaly M., Ausden L., Shang X., Trilk J., Brown M., Feng D., Navarro-Cía M.
2026

IEEE Transactions on Terahertz Science and Technology 16 (2026) , 737-749

Type: Article
Project title: 23IND10: OnMicro: On-wafer microwave metrology for future industrial applications
Name of Call / Funding Programme: Metrology Partnership 2023: Industry
Development of definition and measurement methodology for hardness indentations of Brinell, Vickers and Knoop
Menelao F., KUZU C., GENTA G., Maculotti G., Tunesi M., Prato A., Hiti M., Germak A.
2026

IMEKO TC3, TC5, TC16, TC20, TC22 Joint Conference 2026 (2026)

Type: Article
Project title: 22RPT01: TracInd BVK-H: Traceability for indentation measurements in Brinell-Vickers-Knoop hardness
Name of Call / Funding Programme: Metrology Partnership 2022: Research Potential
6205 RESULT(S)