A Fast and Reliable RF Probing Technique for Autonomous On-Wafer S-Parameter Measurements
Mubarak F., Poduval D., Khot A., Gugole F., Rajabali S., Spirito M.Calibration, on-wafer probing, GSG probes, impedance standard substrate (ISS), on-wafer measurements, RF probe station, RF probing, S-parameters, wafer-level testing
| Document type | Proceedings |
| Journal title / Source | 2026 107th ARFTG Microwave Measurement Conference (ARFTG) |
| Page numbers / Article number | 1-5 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2026-1-1 |
| Conference name | 107th ARFTG Microwave Measurement Conference |
| Conference date | 12 June 2026 |
| Conference place | Boston, MA, USA |
| ISSN | 2767-8776 |
| DOI | 10.1109/ARFTG68740.2026.11614632 |