Interlaboratory mmWave and THz Quasi-Optical Characterization of Commercial Conventional and 3-D Printable Substrates
Sari A., Premerlani R., Hales J., Constantinou C., Gunn J., Ridler N., Naftaly M., Ausden L., Shang X., Trilk J., Brown M., Feng D., Navarro-Cía M.3D printable substrates, extraction algorithm, material characterization, roughness, terahertz (THz), time-domain spectroscopy (TDS), vector network analyzer (VNA)
| Document type | Article |
| Journal title / Source | IEEE Transactions on Terahertz Science and Technology |
| Volume | 16 |
| Issue | 6 |
| Page numbers / Article number | 737-749 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2026-1-1 |
| ISSN | 2156-342X,2156-3446 |
| DOI | 10.1109/TTHZ.2026.3674230 |