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Find all EURAMET Metrology Research Projects
TYPE | FIELD | PROJECT NUMBER | SHORT NAME | TITLE | SHORT DESCRIPTION | COORDINATOR | STATUS | CALL |
---|---|---|---|---|---|---|---|---|
EMRP | Industry | IND56 | Q-AIMDS | Chemical metrology tools to support the manufacture of advanced biomaterials in the medical device industry | Chemical tools support medical industry | Fiona Moriarty | completed | 2012 |
EMRP | Industry | IND57 | MetroNORM | Metrology for processing materials with high natural radioactivity | Processing materials with natural radioactivity | completed | 2012 | |
EMRP | Industry | IND58 | 6DoF | Metrology for movement and positioning in six degrees of freedom | Accurate positioning in three dimensions | Jens Flügge | completed | 2012 |
EMRP | Industry | IND59 | Microparts | Multi-sensor metrology for microparts in innovative industrial products | Multi-sensor measurement for innovation | Ulrich Neuschaefer-Rube | completed | 2012 |
EMRP | Industry | IND60 | EMC | Improved EMC test methods in industrial environments | Ensuring electromagnetic compatibility | Mustafa Cetintas | completed | 2012 |
EMRP | Industry | IND61 | Metrosion | Metrology to enable high temperature erosion testing | Improving high temperature turbine efficiency | Tony Fry | completed | 2012 |
EMRP | Industry | IND62 | TIM | Traceable in-process dimensional measurement | On machine in-process dimension measurement | completed | 2012 | |
EMRP | Industry | IND63 | MetAMC | Metrology for airborne molecular contamination in manufacturing environments | Monitoring for cleanroom air quality | Kaj Nyholm | completed | 2012 |
EMRP | SI Broader Scope | SIB51 | GraphOhm | Quantum resistance metrology based on graphene | Portable quantum resistance standards: Making quantum resistance standards more widely available in industry | completed | 2012 | |
EMRP | SI Broader Scope | SIB52 | Thermo | Metrology for thermal protection materials | Thermal protection for industry: Building confidence in novel thermal protection materials | Jiyu Wu | completed | 2012 |
EMRP | SI Broader Scope | SIB53 | AIM QuTE | Automated impedance metrology extending the quantum toolbox for electricity | Impedance measurements for electrical components: Simple, reliable and cost-effective impedance measurements | Luis Palafox Gámir | completed | 2012 |
EMRP | SI Broader Scope | SIB54 | Bio-SITrace | Traceability for biologically relevant molecules and entities | Better biological measurements: Removing barriers to traceable measurements in biology | completed | 2012 | |
EMRP | SI Broader Scope | SIB55 | ITOC | International timescales with optical clocks | Preparing for a new second: Demonstrating and comparing next generation optical clocks | Helen Margolis | completed | 2012 |
EMRP | SI Broader Scope | SIB56 | SoundPwr | Realisation, dissemination and application of the unit watt in airborne sound | The airborne watt: New measurements of sound power | Volker Wittstock | completed | 2012 |
EMRP | SI Broader Scope | SIB57 | NEWSTAR | New primary standards and traceability for radiometry | Light detection: New light detectors for new light sources | Maria Luisa Rastello | completed | 2012 |
EMRP | SI Broader Scope | SIB58 | Angles | Angle Metrology | New angles: Improving angle measurements for science and industry | Tanfer Yandayan | completed | 2012 |
EMRP | SI Broader Scope | SIB59 | Q-WAVE | A quantum standard for sampled electrical measurements | Electrical traceability: Pushing the boundaries of electrical measurements | Johannes Kohlmann | completed | 2012 |
EMRP | SI Broader Scope | SIB60 | Surveying | Metrology for long distance surveying | Large measurements over long distances: Accurate surveying for science and engineering | Florian Pollinger | completed | 2012 |
EMRP | SI Broader Scope | SIB61 | CRYSTAL | Crystalline surfaces, self assembled structures, and nano-origami as length standards in (nano)metrology | Nanoscale length measurement: Meeting measurement needs for semiconductors and nanotechnology | Ingo Busch | completed | 2012 |
EMRP | SI Broader Scope | SIB62 | HFCircuits | Metrology for new electrical measurement quantities in high-frequency circuits | New measurements for emerging electronics: Benchmarking high-performance, energy-efficient electronics | Nick Ridler | completed | 2012 |
428 result(s)