Characterization of Semiconductor Materials using Synchrotron Radiation-based Near-Field Infrared Microscopy and nano-FTIR Spectroscopy
Hermann PH,
Hoehl AH,
Ulrich GU,
Fleischmann CF,
Hermelink AH,
Kästner BK,
Patoka PP,
Hornemann AH,
Beckhoff BB,
Rühl ER,
Ulm GU
2014
Optics Express
22
(2014)
, 17948-17958
Type:
Article
Project title:
NEW01: TReND: Traceable characterisation of nanostructured devices
Name of Call / Funding Programme:
EMRP A169: Call 2011 Metrology for New Technologies
Performance verification of a dual sensor stage
Yacoot A.,
Mountford J.,
Tedaldi M.,
Reid B.,
Levy S.
2014
Proceedings of the 14th euspen International Conference – Dubrovnik – June 2014
I
(2014)
, P4.38, 309V1
Type:
Proceedings
Project title:
IND58: 6DoF: Metrology for movement and positioning in six degrees of freedom
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
A 5 degrees of freedom μCMM
Küng A.,
Meli F.,
Nicolet A.
2014
Proceedings of the 14th international conference of the european society for precision engineering and nanotechnology
II
(2014)
, P4.28, 269V1
Type:
Proceedings
Project title:
IND58: 6DoF: Metrology for movement and positioning in six degrees of freedom
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
Projekt EMPR JRP ENV07 Metrologia dla meteorologii zakończony
Szmyrka-Grzebyk A,
Grudniewicz E,
Grykałowska A,
Kowal A,
Kołodziej B,
Wełna A,
Kozicki M,
Wiśniewska B
2014
Metrologia i Probiernictwo
4 (7)
(2014)
, 34-39
Type:
Article
Project title:
ENV07: MeteoMet: Metrology for pressure, temperature, humidity and airspeed in the atmosphere
Name of Call / Funding Programme:
EMRP A169: Call 2010 Environment
In-beam tracking refractometry for coordinate interferometric measurement
Holá M.,
Lazar J.,
Cip O.,
Buchta Z.
2014
Proceddings SPIE 9132, Optical Micro- and Nanometrology V
9132
(2014)
Type:
Proceedings
Project title:
IND58: 6DoF: Metrology for movement and positioning in six degrees of freedom
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
Wear Coatings For High Load Applications
Nicholls J.R.,
Craig M.,
Rose T.,
Rao J.
2014
Procedia CIRP
22
(2014)
, 277-280
Type:
Article
Project title:
IND61: Metrosion: Metrology to enable high temperature erosion testing
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
REALIZATION OF SINUSOIDAL FORCES AT CEM
Medina M. N.,
Robles J. L,
de Vicente J.
2014
(2014)
Type:
Proceedings
Project title:
IND09: Dynamic: Traceable Dynamic Measurement of Mechanical Quantities
Name of Call / Funding Programme:
EMRP A169: Call 2010 Industry
Statistical Analysis of BRDF Data for Computer Graphics and Metrology
Langovoy Mikhail A.,
Wübbeler Gerd,
Elster Clemens
2014
Lecture Notes in Engineering and Computer Science: Proceedings of the World Congress on Engineering and Computer Science 2014
2
(2014)
, 785-790
Type:
Proceedings
Project title:
IND52: xDReflect: Multidimensional reflectometry for industry
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
