Metrological Validation of a Digital Model for a CMM including Digital Bias Correction
van Dijk M., Knulst W., Nalbantoglu D., Kok G.CMM, uncertainty, digital twin, ADAM, 23IND12
| Document type | Proceedings |
| Journal title / Source | |
| Publisher's name | Zenodo |
| Publication date | 2026-1-1 |
| Conference name | IMEKO TC-6 International Conference on Metrology and Digital Transformation - M4DConf 2025 |
| Conference date | September 3-5, 2025 |
| Conference place | Benevento, Italy |
| DOI | 10.5281/zenodo.21806608 |