Understanding Physico-Chemical Aspects in the Depth Profiling of Polymer:Fullerene Layers
Surana S., Conard T., Fleischmann C., Tait J.G., Bastos J.P., Voroshazi E., Havelund R., Turbiez M., Louette P., Felten A., Poleunis C., Delcorte A., Vandervorst W.ToF-SIMS, GCIB, Ar cluster, quantification, depth profiling, organics, solar cells, polymer, fullerenes
Document type | Article |
Journal title / Source | The Journal of Physical Chemistry C |
Volume | 120 |
Issue | 49 |
Page numbers / Article number | 28074-28082 |
Publisher's name | American Chemical Society (ACS) |
Publisher's address (city only) | CAS, a division of the American Chemical Society 2540 Olentangy River Road Columbus Ohio 43210 United States |
Publication date | 2016-12 |
ISSN | 1932-7447, 1932-7455 |
DOI | 10.1021/acs.jpcc.6b09911 |
Language | English |