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Understanding Physico-Chemical Aspects in the Depth Profiling of Polymer:Fullerene Layers

Surana S., Conard T., Fleischmann C., Tait J.G., Bastos J.P., Voroshazi E., Havelund R., Turbiez M., Louette P., Felten A., Poleunis C., Delcorte A., Vandervorst W.
Keywords:

ToF-SIMS, GCIB, Ar cluster, quantification, depth profiling, organics, solar cells, polymer, fullerenes

Document type Article
Journal title / Source The Journal of Physical Chemistry C
Volume 120
Issue 49
Page numbers / Article number 28074-28082
Publisher's name American Chemical Society (ACS)
Publisher's address (city only) CAS, a division of the American Chemical Society 2540 Olentangy River Road Columbus Ohio 43210 United States
Publication date 2016-12
ISSN 1932-7447, 1932-7455
DOI 10.1021/acs.jpcc.6b09911
Language English

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Information

Project title (JRP)
14IND01: 3DMetChemIT: Advanced 3D chemical metrology for innovative technologies
Name of Call / Funding Programme
EMPIR 2014: Industry