In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes

Teir L., Lindstedt T., Widmaier T., Hemming B., Brand U., Fahrbach M., Peiner E., Lassila A.

silicon microprobe, high speed, roughness, paper machine roll, metrology

Document type Article
Journal title / Source Sensors
Volume 21
Issue 17
Page numbers / Article number 5955
Publisher's name MDPI AG
Publication date 2021-9
ISSN 1424-8220
DOI 10.3390/s21175955
Language English

Back to the list view