Traceable S-Parameter Measurements Up to 165 GHz Using 0.8 mm Coaxial Standards
Schramm A., Gellersen F., Rausche F., Kuhlmann K.Coaxial, least-squares calibration, offset-short, S-parameter, SI-traceability, vector network analyzer (VNA)
| Document type | Article |
| Journal title / Source | IEEE Microwave and Wireless Technology Letters |
| Volume | 35 |
| Issue | 6 |
| Page numbers / Article number | 936-939 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2025-1-1 |
| DOI | 10.1109/LMWT.2025.3562419 |
| Language | English |