Traceability of S-Parameter Measurements Up to 167 GHz Using 0.8 mm Coaxial Standards
Schramm A., Gellersen F., Rausche F., Kuhlmann K.Coaxial, least-squares calibration, offset short, S-parameter, traceability, vector network analysis
| Document type | Article |
| Journal title / Source | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 73 |
| Issue | 12 |
| Page numbers / Article number | 10542-10551 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2025-1-1 |
| ISSN | 0018-9480,1557-9670 |
| DOI | 10.1109/TMTT.2025.3613009 |