Element sensitive reconstruction of nanostructured surfaces with finite elements and grazing incidence soft X-ray fluorescence
Soltwisch V., Honicke P., Kayser Y., Eilbracht J., Probst J., Scholze F., Beckhoff B.GIXRF, nanostructure characterization, FEM
| Document type | Article |
| Journal title / Source | Nanoscale |
| Publisher's name | Royal Society of Chemistry (RSC) |
| Publication date | 2018 |
| ISSN | 2040-3364, 2040-3372 |
| DOI | 10.1039/C8NR00328A |
| Web URL | https://arxiv.org/abs/1801.04157 |
| Language | English |