Metrology for Virtual Measuring Instruments Illustrated by Three Applications
Schmelter S., Fortmeier I., Heißelmann D.virtual metrology, traceability, uncertainty evaluation, virtual coordinate measuring machine (VCMM), tilted-wave interferometer (TWI), virtual flow meter
| Document type | Article |
| Journal title / Source | Metrology |
| Volume | 5 |
| Issue | 3 |
| Page numbers / Article number | 54 |
| Publisher's name | MDPI AG |
| Publisher's address (city only) | Basel, Switzerland |
| Publication date | 2025-1-1 |
| DOI | 10.3390/metrology5030054 |
| Language | English |