Sampling Depths, Depth Shifts and Depth Resolutions for Bin + Ion Analysis in Argon Gas Cluster Depth Profiles
Havelund R., Seah M.P., Gilmore I.S.Document type | Article |
Journal title / Source | Journal of Physical Chemistry B |
Peer-reviewed article | 1 |
Volume | 120 |
Issue | 9 |
Page numbers / Article number | 2604–2611 |
Publisher's name | ACS |
Publisher's address (city only) | Washington DC |
Publication date | 2016-2-17 |
DOI | 10.1021/acs.jpcb.5b12697 |
Web URL | http://pubs.acs.org/doi/abs/10.1021/acs.jpcb.5b12697 |
Language | English |