Sampling Depths, Depth Shifts and Depth Resolutions for Bin + Ion Analysis in Argon Gas Cluster Depth Profiles

Havelund R., Seah M.P., Gilmore I.S.
Document type Article
Journal title / Source Journal of Physical Chemistry B
Peer-reviewed article 1
Volume 120
Issue 9
Page numbers / Article number 2604–2611
Publisher's name ACS
Publisher's address (city only) Washington DC
Publication date 2016-2-17
DOI 10.1021/acs.jpcb.5b12697
Language English

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