Sampling Depths, Depth Shifts and Depth Resolutions for Bin + Ion Analysis in Argon Gas Cluster Depth Profiles
Havelund R., Seah M.P., Gilmore I.S.| Document type | Article |
| Journal title / Source | Journal of Physical Chemistry B |
| Peer-reviewed article | 1 |
| Volume | 120 |
| Issue | 9 |
| Page numbers / Article number | 2604–2611 |
| Publisher's name | ACS |
| Publisher's address (city only) | Washington DC |
| Publication date | 2016-2-17 |
| DOI | 10.1021/acs.jpcb.5b12697 |
| Web URL | http://pubs.acs.org/doi/abs/10.1021/acs.jpcb.5b12697 |
| Language | English |