Uncertainty evaluation in atomic force microscopy measurement of nanoparticles based on statistical mixed model in a Bayesian framework
Pétry J., De Boeck B., Sebaïhi N., Coenegrachts M., Caebergs T., Dobre M.AFM,mixed model,uncertainty calculation,Bayesian statistics,design of experiment
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Volume | 32 |
| Issue | 8 |
| Page numbers / Article number | 085008 |
| Publisher's name | IOP Publishing |
| Publication date | 2021-5-19 |
| ISSN | 0957-0233, 1361-6501 |
| DOI | 10.1088/1361-6501/abe47f |
| Language | English |