Reliability study of fiber-coupled photodiode module for operation at 4 K

Bardalen E., Karlsen B., Malmbekk H., Akram M.N., Ohlckers P.

Optoelectronic packaging, Cryogenics, Voltage standards

Document type Article
Journal title / Source Microelectronics Reliability
Volume 81
Issue February 2
Page numbers / Article number 362-367
Publisher's name Elsevier BV
Publication date 2018-2
ISSN 0026-2714
DOI 10.1016/j.microrel.2017.10.034
Language English

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