On Band Stitching for Wideband Vector Measurements With Vector Signal Analyzers
Nielsen J.O., Fan W., Ji Y.Band-stitching, EVM measurements, and subband impairment correction.
| Document type | Article |
| Journal title / Source | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 71 |
| Issue | 2 |
| Page numbers / Article number | 710-718 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2023-2 |
| ISSN | 0018-9480, 1557-9670 |
| DOI | 10.1109/TMTT.2022.3207997 |
| Web URL | https://vbn.aau.dk/en/publications/on-band-stitching-for-wideband-vector-measurements-with-vector-si |
| Language | English |