Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
Shard A., Havelund R., Spencer S., Gilmore I., Alexander M.R., Angerer T.B., Aoyagi S., Barnes J.P., Benayad A., Bernasik A., Ceccone G., Counsell J.D.P, Deeks C., Fletcher J.S., Graham D.J., Heuser C., Lee T.G., Marie C., Marzec M.M., Mishra G., Rading D., Renault O., Scurr D.J, Shon H.K., Spampinato V., Tian H., Wang F., Winograd N., Wu K., Wucher A.| Document type | Article |
| Journal title / Source | Journal of Physical Chemistry (B) |
| Peer-reviewed article | 1 |
| Volume | 119 |
| Issue | 33 |
| Page numbers / Article number | 10784–10797 |
| Publisher's name | ACS |
| Publisher's address (city only) | Washington DC |
| Publication date | 2015-7-23 |
| DOI | 10.1021/acs.jpcb.5b05625 |
| Web URL | http://pubs.acs.org/doi/abs/10.1021/acs.jpcb.5b05625 |
| Language | English |