Robust Numerical Solver for Nonlinear Semiconductor Problems
Kupresak M., Eckmann B., Hoffmann J., Baumann M., Peter P., Smajic J.drift-diffusion model, finite element method, scanning microwave microscopy, semiconductor
| Document type | Article |
| Journal title / Source | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 73 |
| Issue | 9 |
| Page numbers / Article number | 6051-6058 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2025-1-1 |
| DOI | 10.5281/zenodo.17376100 |
| Language | English |