SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions
Havelund R., Seah M. P., Tiddia M., Gilmore I. S.SIMS
Document type | Article |
Journal title / Source | Journal of The American Society for Mass Spectrometry |
Volume | 29 |
Issue | 4 |
Page numbers / Article number | 774-785 |
Publisher's name | Springer US |
Publication date | 2018-2-21 |
ISSN | 1044-0305, 1879-1123 |
DOI | 10.1007/s13361-018-1905-2 |
Web URL | https://link.springer.com/article/10.1007%2Fs13361-018-1905-2 |
Language | English |