SIMS of organics - Advances in 2D and 3D imaging and future outlook
Gilmore I.Secondary ion mass spectroscopy; Sputtering; Ionization; Medical imaging; Mass spectrometry; Matrix assisted laser desorption ionization; Focused ion beam technology; Ion beams; Ion sources; Spatial resolution
Document type | Article |
Journal title / Source | Journal of Vacuum Science & Technology |
Volume | 31 |
Issue | 5 |
Publication date | 2013-8-27 |
ISSN | 0734-2101 |
DOI | 10.1116/1.4816935 |
Web URL | http://link.aip.org/link/?JVA/31/050819 |