SIMS of organics - Advances in 2D and 3D imaging and future outlook

Gilmore I.

Secondary ion mass spectroscopy; Sputtering; Ionization; Medical imaging; Mass spectrometry; Matrix assisted laser desorption ionization; Focused ion beam technology; Ion beams; Ion sources; Spatial resolution

Document type Article
Journal title / Source Journal of Vacuum Science & Technology
Volume 31
Issue 5
Publication date 2013-8-27
ISSN 0734-2101
DOI 10.1116/1.4816935

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