Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Fleischmann C., Conard T., Havelund R., Franquet A., Poleunis C., Voroshazi E., Delcorte A., Vandervorst W.depth profiling, sputter yield, ion yield, matrix effect, OPV, P3HT, PCDTBT, PCBM
| Document type | Article |
| Journal title / Source | Surface and Interface Analysis |
| Peer-reviewed article | 1 |
| Volume | 1 |
| Issue | 46 |
| Page numbers / Article number | 54-57 |
| Publisher's name | Wiley Online Library |
| Publisher's address (city only) | New Jersey NYC |
| Publication date | 2016 |
| ISSN | 0142-2421 |
| DOI | 10.1002/sia.5621 |
| Web URL | http://onlinelibrary.wiley.com/doi/10.1002/sia.5621/abstract |
| Language | English |