Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Fleischmann C., Conard T., Havelund R., Franquet A., Poleunis C., Voroshazi E., Delcorte A., Vandervorst W.

depth profiling, sputter yield, ion yield, matrix effect, OPV, P3HT, PCDTBT, PCBM

Document type Article
Journal title / Source Surface and Interface Analysis
Peer-reviewed article 1
Volume 1
Issue 46
Page numbers / Article number 54-57
Publisher's name Wiley Online Library
Publisher's address (city only) New Jersey NYC
Publication date 2016
ISSN 0142-2421
DOI 10.1002/sia.5621
Language English

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