Application of contact-resonance AFM methods to polymer samples
Friedrich S., Cappella B.atomic force microscopy, contact resonance, mechanical properties, polymers; wear
| Document type | Article |
| Journal title / Source | Beilstein Journal of Nanotechnology |
| Volume | 11 |
| Page numbers / Article number | 1714-1727 |
| Publisher's name | Beilstein Institut |
| Publication date | 2020-11-12 |
| ISSN | 2190-4286 |
| DOI | 10.3762/bjnano.11.154 |
| Language | English |