Application of contact-resonance AFM methods to polymer samples

Friedrich S., Cappella B.

atomic force microscopy, contact resonance, mechanical properties, polymers; wear

Document type Article
Journal title / Source Beilstein Journal of Nanotechnology
Volume 11
Page numbers / Article number 1714-1727
Publisher's name Beilstein Institut
Publication date 2020-11-12
ISSN 2190-4286
DOI 10.3762/bjnano.11.154
Language English

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