Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size
Seah M.P., Spencer S.J., Havelund R., Gilmore I.S., Shard A.G.Document type | Article |
Journal title / Source | Analyst |
Peer-reviewed article | 1 |
Volume | 140 |
Issue | 19 |
Page numbers / Article number | 6508-6516 |
Publisher's name | Royal Society of Chemistry |
Publisher's address (city only) | London |
Publication date | 2015-8-25 |
ISSN | 0003-2654 |
DOI | 10.1039/C5AN01473E |
Web URL | http://pubs.rsc.org/en/content/articlelanding/2015/an/c5an01473e#!divAbstract |
Language | English |