Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

Seah M.P., Spencer S.J., Havelund R., Gilmore I.S., Shard A.G.
Document type Article
Journal title / Source Analyst
Peer-reviewed article 1
Volume 140
Issue 19
Page numbers / Article number 6508-6516
Publisher's name Royal Society of Chemistry
Publisher's address (city only) London
Publication date 2015-8-25
ISSN 0003-2654
DOI 10.1039/C5AN01473E
Web URL!divAbstract
Language English

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