Depth Resolution, Angle-Dependence and the Sputtering Yield of Irganox 1010 by Coronene Primary Ions

Seah M.P., Spencer S.J., Shard A.G.

cluster ions, depth profiling, organic layers, SIMS, XPS.

Document type Article
Journal title / Source Journal of Physical Chemistry
Peer-reviewed article 1
Volume 117
Issue 39
Page numbers / Article number 11885–11892
Publisher's name ACS
Publisher's address (city only) Washington DC
Publication date 2013-10-6
DOI 10.1021/jp408168z
Language English

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