Depth Resolution, Angle-Dependence and the Sputtering Yield of Irganox 1010 by Coronene Primary Ions
Seah M.P., Spencer S.J., Shard A.G.cluster ions, depth profiling, organic layers, SIMS, XPS.
Document type | Article |
Journal title / Source | Journal of Physical Chemistry |
Peer-reviewed article | 1 |
Volume | 117 |
Issue | 39 |
Page numbers / Article number | 11885–11892 |
Publisher's name | ACS |
Publisher's address (city only) | Washington DC |
Publication date | 2013-10-6 |
DOI | 10.1021/jp408168z |
Web URL | http://pubs.acs.org/doi/abs/10.1021/jp408168z |
Language | English |