Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry (SIMS)
Yang L, Seah M, Gilmore I .S, Morris R.J.H, Dowsett M.G, Boarino L, Sparnacci K, Laus Mcluster ion beams, core-shell, melting, SEM, Stöber silica, SiO2
| Document type | Article |
| Journal title / Source | J. Phys. Chem. C |
| Peer-reviewed article | 1 |
| Volume | 117 |
| Issue | 31 |
| Page numbers / Article number | 16042-16052 |
| Publisher's name | American chemical society |
| Publisher's address (city only) | Washington DC |
| Publication date | 2016 |
| ISSN | 1932-7447 |
| DOI | 10.1021/jp4048538 |
| Web URL | http://pubs.acs.org/doi/abs/10.1021/jp4048538 |
| Language | English |