Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry (SIMS)

Yang L, Seah M, Gilmore I .S, Morris R.J.H, Dowsett M.G, Boarino L, Sparnacci K, Laus M

cluster ion beams, core-shell, melting, SEM, Stöber silica, SiO2

Document type Article
Journal title / Source J. Phys. Chem. C
Peer-reviewed article 1
Volume 117
Issue 31
Page numbers / Article number 16042-16052
Publisher's name American chemical society
Publisher's address (city only) Washington DC
Publication date 2016
ISSN 1932-7447
DOI 10.1021/jp4048538
Language English

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