Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry (SIMS)
Yang L, Seah M, Gilmore I .S, Morris R.J.H, Dowsett M.G, Boarino L, Sparnacci K, Laus Mcluster ion beams, core-shell, melting, SEM, Stöber silica, SiO2
Document type | Article |
Journal title / Source | J. Phys. Chem. C |
Peer-reviewed article | 1 |
Volume | 117 |
Issue | 31 |
Page numbers / Article number | 16042-16052 |
Publisher's name | American chemical society |
Publisher's address (city only) | Washington DC |
Publication date | 2016 |
ISSN | 1932-7447 |
DOI | 10.1021/jp4048538 |
Web URL | http://pubs.acs.org/doi/abs/10.1021/jp4048538 |
Language | English |