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EMUE-D5-1-PixelVoxelUncertainty

Caebergs T., Cox M.
Keywords:

pixellation, image metrology, modelling, SPECT imaging, absorbed dose calculation, uncertainty evaluation, nanoparticles, AFM

Document type Datasets
Journal title / Source
DOI 10.5281/zenodo.5027868

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Information

Project title (JRP)
17NRM05: EMUE: Advancing measurement uncertainty - comprehensive examples for key international standards
Name of Call / Funding Programme
EMPIR 2017: Pre-Co-Normative