In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes (data)
silicon microprobe, high speed, roughness, paper machine roll, metrology
| Document type | Datasets |
| Journal title / Source | |
| Web URL | https://zenodo.org/record/5705505 |
| Persistent Identifier | https://doi.org/10.5281/zenodo.5705505 |