For precise dimensional measurements the use of high-resolution instruments is necessary to resolve tiny micro and even nanostructures and to determine their dimensional and other properties. The NanoScale seminar will stimulate the exchange of information between metrologists, users in science and industry, and manufacturers of relevant hardware, i.e. optical, electron and scanning probe techniques, and software.
The following EMRP and EMPIR projects will be presenting at the seminar:
- Multi-sensor metrology for microparts in innovative industrial products (IND59 Microparts) will develop 3D measurements of microparts to verify them, ensuring they function correctly in industrial applications
- Metrology for movement and positioning in six degrees of freedom (IND58 6DoF) will develop measurement instruments to support traceable six degrees of freedom (6DoF) measurement and use interferometry techniques to establish a direct link to the definition of the metre
- Traceable measurement of mechanical properties of nano-objects (NEW05 MechProNO) will develop measurement traceability for the mechanical properties of nano-objects such as nanoparticles, nanowires and composite materials through the development of test samples, new techniques and improved instruments
- Crystalline surfaces, self-assembled structures, and nano-origami as length standards in (nano) metrology (SIB61 CRYSTAL) will develop new types of dimensional standards using crystalline surfaces, self-assembled structures and nano-origami for step height and lateral resolution measurements, for the traceable measurement of nanoparticles and carbon nanotubes
- Metrology for III-V materials based high efficiency multi-junction solar cells (ENG51 SolCell) will reduce the costs of generating electricity from PV by developing the metrological tools required to increase the efficiency of current devices, while improving manufacturing processes and materials.
