EMRP project Metrology for movement and positioning in six degrees of freedom (IND58 6DoF) will develop measurement instruments to support traceable six degrees of freedom (6DoF) measurement and use interferometry techniques to establish a direct link to the definition of the metre.
IND58 partners will be presenting at the event. The NanoMetrology France event deals with advancements in all the metrological aspects related to nanoscience and nanotechnology. It is open to all areas connected to both theoretical and experimental aspects of metrology at the nanometre scale, from new methodologies for the quantitative characterisation of nanomaterials, to new results in the fields of characterization of nanomaterials and realization of nanometrological standards, which represent key issues for making possible a successful technological transfer of nanotechnology.
