Keysight Insight Seminar Series: Do's and Don'ts for mm-wave Antenna Characterization

EMRP project  Metrology for optical and RF communication systems (IND51 MORSE) will develop new measurement procedures and services to support the introduction of new multiple antenna systems, satellite system testing and the next generation of optical communications equipment.

IND51 JRP-Partners will participate in the Keysight/TU Delft seminar. In this seminar, attendees will review the pitfalls and solutions adopted in various mm-wave characterisation laboratories throughout Europe, ranging from near-field, compact-range and far-field setups, addressing both the connectorised and the on-wafer world, with their unique features and problems.

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