Advanced characterisation of materials symposium - to be held at Spring 2024 meeting of the European Materials Research Society

27 – 31 May 2024, Convention and Exhibition Centre of Strasbourg, France

Spring 2024 meeting of the European Materials Research Society

The European Materials Research Society 2024 Spring conference will consist of parallel symposia with invited speakers, oral and poster presentations in a series of plenary sessions to provide an international forum for discussing recent advances in the field of materials science.

The scientific program will address different topics organised into 21 symposia arranged in 6 clusters covering the fields of:

  • Decarbonised energy and sustainability
  • Materials for human well-being
  • 2D materials and surfaces: synthesis, characterisation and perspectives
  • Advanced characterisation of materials
  • Materials sciences for cultural heritage
  • Electronics, magnetics and photonics


Full details of EMRS 2024 Spring meeting

Abstract submission for ALTECH 2024 - Deadline 18 January 2024

Advanced characterisation of materials symposium

EMPIR project Memristive devices as quantum standard for nanometrology (20FUN06, MEMQuD) and Metrology Partnership project Operando metrology for energy storage materials (21GRD01, OpMetBat) will contribute to the ALTECH 2024 symposium entitled Analytical techniques for accurate nanoscale characterization of advanced materials symposium.

Topics to be covered by this symposium include:

  • Hybrid and correlative metrology for complex thin films and nanomaterials
  • Scanning probe techniques for high resolution characterisation of organic, hybrid and inorganic semiconductors
  • X-Ray diffraction, tomography, scattering and spectrometry-based applications on advanced materials and in nanoscience
  • Advanced optical techniques, including spectroscopic, ultramicroscopy, interferometric and non-interferometric methods
  • Metrology for energy materials, including energy conversion and storage
  • Metrology for compound semiconductors materials and devices
  • Recent developments of ion beam techniques for characterisation of lateral and vertical thin films
  • Analytical techniques for characterisation of surface chemistry and of functionalised surfaces
  • Nanometrology: ex-situ, in-situ and operando measurement methods, reference materials and calibration samples
  • Methods for measurement of nanomaterials in complex matrices, including health and environmental safety assessment


ALTECH 2024 - Analytical techniques for accurate nanoscale characterization of advanced materials symposium

Symposium contacts:

EMPIR projects are co-funded by the European Union's Horizon 2020 research and innovation programme and the EMPIR Participating States.

Metrology Partnership projects have received funding from the European Partnership on Metrology, co-financed by the European Union Horizon Europe Research and Innovation Programme and from the Participating States.