Peer review of the self declared quality system of the LNE
Project Description
As a support for the CMCs claimed by LNE in the framework of the self declared quality system for the technical fields: DC voltage, resistance in DC and AC, capacitance, AC/DC transfer, low frequency power and quantities in high frequency domain, two peer visits will be carried out in the laboratories of the LNE this year. The first visit is planned on 1 and 2 July and the peer reviewers are Dr. Umberto Pogliano and Dr. Luciano Brunetti from INRIM. This audit concerns the low frequency and high frequency fields in applied electrical metrology domain. The corresponded CMC capabilities are: 45-48, 100.1-100.2 (matrix1), 101 (matrix30), 167.1 (matrix2), 178f-178g, 265-274, 292, 300 to 304.
The second visit is planned on 7 and 8 October with Stéphane Solve and Roland Goebel from BIPM and Frédéric Overney from METAS as the peer reviewers. This audit deals with the DC and low frequency fields in fundamental electrical metrology area. The corresponded CMC capabilities are: 1 to 3, 18 to 20, 53 to 55.
Final Report 2008-12-08
As a support for the CMCs claimed by LNE in the framework of the self declared quality system for the technical fields: DC voltage, resistance in DC and AC, ca-pacitance, AC/DC transfer, low frequency power and quantities in the high fre-quency domain, two peer visits have been carried out in the laboratories of the LNE in 2008.
The first visit was arranged on 1 July and the peer reviewers were Dr Umberto Pogliano and Dr Luciano Brunetti from INRIM. This audit concerned the low fre-quency and high frequency fields in the applied electrical metrology area. The corresponding CMC capabilities are: 45-48, 100.1-100.2 (matrix1), 101 (ma-trix30), 167.1 (matrix2), 178f-178g, 265-274, 292, 300 to 304.
The second visit was organized on 7 and 8 October with Stéphane Solve and Ro-land Goebel from BIPM and Frédéric Overney from METAS as the peer reviewers. Dominique Oster from LNE also carried out an internal audit in parallel. These audits dealt with the DC and low frequency fields in the fundamental electrical metrology area. The corresponded CMC capabilities are 2 to 3, 18 to 20, 53 to 55.
The reviewers declared the general outcome of the audits positive. The results are documented in reports