Dissemination and verification of dimensional nanometrology technologies
Project description
This project will share knowledge between NPL and CMI on aspects of dimensional nano metrology with the aim of improving measuring accuracy and disseminating dimensional nano metrology to the wider nanotechnology community. In particular, we will concentrate on metrology for AFMs and nanopositioning as well as the more general dissemination of nanometrology to the wider community.
Progress Report 2024-10-18
Written software for acquisition of muli axis data from force distance curves using AFMs in the LabVIEW version of the Gwyscan library.
Published joint papers:
Sun X et al Three-dimensional drift correction of localised non-raster scanning on atomic force microscopy
Meas. Sci. Technol. 35 (2024) 117003 (8pp)
Klapetek P et al. Stitching accuracy in large area scanning probe microscopy Discussed joint contributions for EU partnerships projects
Meas. Sci. Technol. 35 (2024) 125026 (12pp)
CMI and NPL (A. Yacoot & NPL Data Science Team) worked together to write a PRT on digitalisation for nanometrology, his was successful and SRT submitted September 2024.
Visits:
- November 2023: A. Yacoot visited CMI to undertake audit of CMI Nanometrology Department for CMI Director, work on paper writing & discuss ideas for PRT
- December 2023: P. Klapetek visited NPL to set up GWYSCOPE (CMI AFM) controller at NPL: first image obtained, controller returned to CMI for updating
- February 2024: A. Yacoot visited CMI: work on papers, PRT writing and joint measurements.
Progress Report 2023-09-28
- Written software for acquisition of muli axis data from force distance curves using AFMs in the LabVIEW version of the Gwyscan library
- Published joint paper Nečas D, Yacoot A., Valtr M. and Klapetek P., 2023 "Demystifying data evaluation in the measurement of periodic structures"
https://doi.org/10.1088/1361-6501/acbab3 - Discussed joint contributions for EU partnerships projects