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Dimensional measurements - Using AFM and profilometers in Surface Measurement

Project Description

Two staff members from the Hellenic Institute of Metrology (Ioannis Kourpouas and Konstantinos Athanassiadis) shall visit the Danish Fundamental Metrology from 2007-06-18 to 2007-06-22 where the following subjects shall be discussed and demonstrated using facilities at DFM

1. AFM and nanometrology for measurement of roughness, texture and finish.
2. AFM with capacitive sensors including actual measurements.
3. Uncertainty parameters and budgets.
4. Roughness measurements with stylus instruments.
Form of consultance:
The consultancy and discussion shall be conducted in the form of theoretical lectures, discussions, exercises on pc and practical training with hands-on in the laboratories.


Final Report 2007-10-25

Two staff members from the Hellenic Institute of Metrology (Mr. Ioannis Kouroupas and Professor Konstantinos Athanassiadis) visited the Danish Fundamental Metrology from 2007-06-18 to 2007-06-22 where the following subjects was discussed and demonstrated using facilities at DFM:

1.       AFM and nanometrology for measurement of roughness, texture and finish.
2.       AFM with capacitive sensors including actual measurements.
3.       Uncertainty parameters and budgets.
4.       Roughness measurements with stylus instruments.

Form of consultancy:

The consultancy and discussion was conducted in the form of theoretical lectures, discussions, exercises on pc and practical training with hands-on in the laboratories.

Subjects
Length (L)
Coordinator
Joergen Garnaes, DFM (Denmark)
Coordinating Institute
DFM (Denmark)
Participating Partners
EIM (Greece)

Information

Reg. No.
1005
Collaboration Type
Consultation
Status
completed
Starting
2007-06-14
Completion
2007-06-22