Towards a novel programmable Josephson voltage standard for sampled power measurements
Trinchera B.,
Serazio D.,
Durandetto P.,
Oberto L.,
Fasolo L.
2022
Proceedings of the 25th IMEKO TC4 International Symposium and 23rd International Workshop on ADC and DAC Modelling and Testing
(2022)
Type:
Proceedings
Project title:
19RPT01: QuantumPower: Quantum traceability for AC power standards
Name of Call / Funding Programme:
EMPIR 2019: Research Potential
Bimodal Approach for Noise Figures of Merit Evaluation in Quantum-Limited Josephson Traveling Wave Parametric Amplifiers
Fasolo L.,
Barone C.,
Borghesi M.,
Carapella G.,
Caricato A.P.,
Carusotto I.,
Chung W.,
Cian A.,
Di Gioacchino D.,
Enrico E.,
Falferi P.,
Faverzani M.,
Ferri E.,
Filatrella G.,
Gatti C.,
Giachero A.,
Giubertoni D.,
Greco A.,
Kutlu C.,
Leo A.,
Ligi C.,
Livreri P.,
Maccarone G.,
Margesin B.,
Maruccio G.,
Matlashov A.,
Mauro C.,
Mezzena R.,
Monteduro A.G.,
Nucciotti A.,
Oberto L.,
Pagano S.,
Pierro V.,
Piersanti L.,
Rajteri M.,
Rettaroli A.,
Rizzato S.,
Semertzidis Y.K.,
Uchaikin S.V.,
Vinante A.
2022
IEEE Transactions on Applied Superconductivity
(2022)
Type:
Article
Project title:
17FUN10: ParaWave: Josephson travelling wave parametric amplifier and its application for metrology
Name of Call / Funding Programme:
EMPIR 2017: Fundamental
Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfaces
Soltwisch V.,
Skroblin D.,
Nikolaev K.,
Siefke T.,
Andrle A.,
Kayser Y.,
Hönicke P.,
Gollwitzer C.,
Krumrey M.,
Fernández Herrero A.
2022
Nanoscale
14
(2022)
, 15475-15483
Type:
Article
Project title:
20IND04: ATMOC: Traceable metrology of soft X-ray to IR optical constants and nanofilms for advanced manufacturing
Name of Call / Funding Programme:
EMPIR 2020: Industry
Bayesian Target‐Vector Optimization for Efficient Parameter Reconstruction
Plock M.,
Andrle K.,
Burger S.,
Schneider P‐I.
2022
Advanced Theory and Simulations
5
(2022)
, 2200112
Type:
Article
Project title:
20IND04: ATMOC: Traceable metrology of soft X-ray to IR optical constants and nanofilms for advanced manufacturing
Project title:
20FUN02: POLight: Pushing boundaries of nano-dimensional metrology by light
Name of Call / Funding Programme:
EMPIR 2020: Industry