Atomic structure and annealing-induced reordering of ε-Ga2O3: A Rutherford backscattering/channeling and spectroscopic ellipsometry study
Zolnai Z., Petrik P., Németh A., Volk J., Bosi M., Seravalli L., Fornari R.Ga2O3, Rutherford Backscattering, Spectroscopic Ellipsometry, Crystalline reordering and annealing
| Document type | Article |
| Journal title / Source | Applied Surface Science |
| Volume | 636 |
| Page numbers / Article number | 157869 |
| Publisher's name | Elsevier BV |
| Publisher's address (city only) | Amsterdam, NX, Netherlands |
| Publication date | 2023-11 |
| ISSN | 0169-4332 |
| DOI | 10.1016/j.apsusc.2023.157869 |
| Language | English |