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On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz

Zinal, S., Arz, U. (PTB, Braunschweig, Germany), Doerner, R. and Probst, T.
Keywords:

Calibration, Substrates, Standards, Probes, Aluminum oxide, Frequency measurement,

Document typeProceeding
Journal title / Source2018 91st ARFTG Microwave Measurement Conference (ARFTG)
Publisher's nameIEEE
Publication date 2018-06
Conference name2018 91st ARFTG Microwave Measurement Conference (ARFTG)
Conference date15-06-2018 to 15-06-2018
Conference placePhiladelphia, PA, USA
DOI10.7795/EMPIR.14IND02.CA.20190403C
Web URLhttps://doi.org/10.1109/ARFTG.2018.8423829
LanguageEnglish

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