On the Importance of Calibration Standards Definitions for On-Wafer Measurements up to 110 GHz
Zinal S., Arz U., Doerner R. , Probst T.Calibration, Substrates, Standards, Probes, Aluminum oxide, Frequency measurement,
| Document type | Proceedings |
| Journal title / Source | 2018 91st ARFTG Microwave Measurement Conference (ARFTG) |
| Publisher's name | IEEE |
| Publication date | 2018-6 |
| Conference name | 2018 91st ARFTG Microwave Measurement Conference (ARFTG) |
| Conference date | 15-06-2018 to 15-06-2018 |
| Conference place | Philadelphia, PA, USA |
| DOI | 10.7795/EMPIR.14IND02.CA.20190403C |
| Web URL | https://doi.org/10.1109/ARFTG.2018.8423829 |
| Language | English |