Guidelines for Traceable Measurements of Electrical Parameters of SSL
Zhao D., Rietveld G., Braun J., Overney F., Lippert T., Christensen A.| Document type | Technical report |
| Journal title / Source | |
| Institution | VSL, Netherlands (Zhao, Rietveld); METAS, Switzerland (Braun, Overney); Trescal, Denmark (Lippert, Christensen) |
| Publication date | 2013-4-6 |