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Infrared spectrometric measurement of impurities in highly enriched ‘Si28’

Zakel S., Wundrack S., Niemann H., Rienitz O., Schiel D.
Keywords:

Infrared spectrometric measurement, Silicon, Avogadro constant

Document type Article
Journal title / Source Metrologia
Volume 48
Issue 2
Publication date 2011
DOI 10.1088/0026-1394/48/2/S02

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Information

Project title (JRP)
T1.J1.2: NAH: Avogadro and molar Planck constants for the redefinition of the kilogram
Name of Call / Funding Programme
iMERA-Plus: Call 2007 SI and Fundamental Metrology