Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS
Belsey N.A., Cant D., Cant D.J.H., Minelli C., Araujo J.R., Bock B., Brüner P., Castner D.G., Ceccone G., Counsell J.D.P., Dietrich P.M., Engelhard M.H., Fearn S., Galhardo C.E., Kalbe H., Kim J.W., Lartundo-Rojas L., Luftman H.S., Nunney T.S., Pseiner J., Smith E.F., Spampinato V., Sturm J.M., Thomas A.G., Treacy J.P.W., Veith L., Wagstaffe M., Wang H., Wang Y.C., Wang M., Werner W., Yang L.VAMAS, XPS, LEIS, nanoparticle, core-shell, thickness, interlaboratory
Document type | Article |
Journal title / Source | The Journal of Physical Chemistry C |
Volume | 120 |
Issue | 42 |
Page numbers / Article number | 24070-24079 |
Publisher's name | American Chemical Society (ACS) |
Publisher's address (city only) | CAS, a division of the American Chemical Society2540 Olentangy River Road Columbus Ohio 43210 United States |
Publication date | 2016-10-27 |
ISSN | 1932-7447, 1932-7455 |
DOI | 10.1021/acs.jpcc.6b06713 |
Web URL | https://spiral.imperial.ac.uk/handle/10044/1/40824 |
Language | English |