Assessing the Impact of Data Filtering Techniques on Material Characterization at Millimeter-Wave Frequencies
Wu W., Ridler N., Shang X., Ma D.Data filtering, dielectric constant, loss tangent, millimeter-wave measurements, time-domain gating, vector network analyzer (VNA)
| Document type | Article |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | 70 |
| Issue | N/A |
| Page numbers / Article number | 6005904 |
| Publisher's name | IEEE |
| Publication date | 2021-3-18 |
| ISSN | 1557-9662 |
| DOI | 10.1109/TIM.2021.3067224 |
| Language | English |