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Compressed sensing FTIR nano-spectroscopy and nano-imaging

Kästner, Bernd, Schmähling, Franko, Hornemann, Andrea, Ulrich, Georg, Hoehl, Arne, Kruskopf, Mattias, Pierz, Klaus, Raschke, Markus B., Wübbeler, Gerd (Physikalisch-Technische Bundesanstalt) and Elster, C. (Physikalisch-Technische Bundesanstalt)
Keywords:

Infrared scattering scanning near-field optical microscopy, Optical spectroscopy, Compressed sensing

Document typeArticle
Journal title / SourceOptics Express
Volume26
Issue14
Page numbers / Article number18115
Publisher's nameThe Optical Society
Publication date 2018-06-28
ISSN1094-4087
DOI10.1364/OE.26.018115
Web URLhttps://www.osapublishing.org/oe/abstract.cfm?uri=oe-26-14-18115
LanguageEnglish

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