VNA tools II: Calibrations involving eigenvalue problems

Wollensack M., Hoffmann J., Stalder D., Ruefenacht J.

Vector Network Analyzer, S-parameters, Calibration, Uncertainty, Traceability

Document type Proceedings
Journal title / Source 2017 89th ARFTG Microwave Measurement Conference (ARFTG)
Volume 1
Issue 1
Page numbers / Article number 1-4
Publisher's name IEEE
Publication date 2017-6
Conference name Wollensack, Michael, et al.
Conference date 09-06-2017 to 10-06-2017
Conference place Honolulu
DOI 10.7795/EMPIR.14IND02.CA.20190404
ISBN 978-1-5386-2748-8
Language English

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