Microfocusing at the PG1 beamline at FLASH

Weigelt H., Siewert F., Rübhausen M., Reininger R., Mey T., Goderich R., Gerasimova N., Dziarzhytski S., Yandayan T.

synchrotron optics; X-ray optics; metrology for synchrotron optics; slope measurement; NOM; multilayer; focusing mirrors

Document type Article
Journal title / Source Journal of Synchrotron Radiation
Volume 23
Issue 1
Page numbers / Article number 123-131
Publisher's name International Union of Crystallography (IUCr)
Publication date 2016-1
ISSN 1600-5775
DOI 10.1107/S1600577515023127
Language English

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